Simplex Solutions, Inc.
🏢 View company profile →4Patents
0Active
4Granted
27Portfolio score
Filing activity: Dec 8, 1997 → Mar 27, 2000
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5999010A | Method of measuring interconnect coupling capacitance in an IC chip | Physics | 36 | Expired |
| US6480986B1 | IC substrate noise modeling including extracted capacitance for improved accuracy | Electricity | 9 | Expired |
| US6438733B1 | IC substrate noise modeling with improved surface gridding technique | Electricity | 7 | Expired |
| US6291324A | Method of modeling IC substrate noises utilizing improved doping profile access | Electricity | 6 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.