Verigy IPco
7Patents
0Active
7Granted
26Portfolio score
Filing activity: Jul 19, 2001 → Oct 19, 2005
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7131046B2 | System and method for testing circuitry using an externally generated signature | Physics | 23 | Expired |
| US7137083B2 | Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure | Physics | 8 | Expired |
| US7106081B2 | Parallel calibration system for a test device | Physics | 6 | Expired |
| US7147499B1 | Zero insertion force printed circuit assembly connector system and method | Physics | 5 | Expired |
| US7146539B2 | Systems and methods for testing a device-under-test | Physics | 2 | Expired |
| US7137052B2 | Methods and apparatus for minimizing current surges during integrated circuit testing | Physics | 0 | Expired |
| US7112977B2 | Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.