Wells-CTI, LLC
14Patents
2Active
14Granted
33Portfolio score
Filing activity: May 16, 1997 → Oct 30, 2007 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7042240B2 | Burn-in testing apparatus and method | Physics | 49 | Expired |
| US6368137B1 | Vertically actuated BGA socket | Physics | 28 | Expired |
| US6162066A | Socket for positioning and installing an integrated circuit chip on a flexible connector sheet | Electricity | 27 | Expired |
| US7108517B2 | Multi-site chip carrier and method | Physics | 24 | Expired |
| US6217341A | Integrated circuit test socket having torsion wire contacts | Electricity | 19 | Expired |
| US6045370A | Test socket for electronic module | Physics | 15 | Expired |
| US5990693A | Test contactor | Physics | 10 | Expired |
| US7030638B2 | Method and device with variable resilience springs for testing integrated circuit packages | Physics | 10 | Expired |
| US7187189B2 | Burn-in testing apparatus and method | Physics | 6 | Expired |
| US7482825B2 | Burn-in testing apparatus and method | Physics | 5 | Active |
| US7394271B2 | Temperature sensing and prediction in IC sockets | Physics | 5 | Expired |
| US6162080A | Socket for positioning and installing an integrated circuit on a circuit board | Electricity | 3 | Expired |
| US7312620B2 | Burn-in testing apparatus and method | Physics | 3 | Active |
| US7123037B2 | Integrated circuit temperature sensing device and method | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.