Xallent Inc.
10Patents
10Active
10Granted
46Portfolio score
Filing activity: Feb 26, 2016 → Aug 19, 2021
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10613115B2 | Multiple integrated tips scanning probe microscope | Physics | 2 | Active |
| US10436814B2 | Systems and methods for manufacturing nano-electro-mechanical-system probes | Physics | 2 | Active |
| US10895585B2 | Multiple integrated tips scanning probe microscope | Physics | 0 | Active |
| US12085589B2 | Fine pitch probe card | Electricity | 0 | Active |
| US10663484B2 | Multiple integrated tips scanning probe microscope with pre-alignment components | Physics | 0 | Active |
| US11125774B2 | Systems and methods for manufacturing nano-electro-mechanical-system probes | Physics | 0 | Active |
| US10866273B2 | Functional prober chip | Electricity | 0 | Active |
| US11280825B2 | Functional prober chip | Electricity | 0 | Active |
| US11573247B2 | Systems and methods for manufacturing nano-electro-mechanical-system probes | Physics | 0 | Active |
| US10545171B2 | Systems and methods for manufacturing nano-electro-mechanical-system probes | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.