Ajay Baranwal
11Patents
2h-index
8Co-inventors
39Inventor score
Filing activity: May 18, 2018 → Jan 30, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10592634B1 | Systems and methods for automatic handling of engineering design parameter violations | Physics | 8 | Active |
| US11250199B1 | Methods and systems for generating shape data for electronic designs | Physics | 2 | Active |
| US11182929B2 | Methods and systems for compressing shape data for electronic designs | Physics | 1 | Active |
| US11847400B2 | Methods and systems for generating shape data for electronic designs | Physics | 0 | Active |
| US12287567B2 | Method and system for reticle enhancement technology | Physics | 0 | Active |
| US12288022B2 | Methods and systems for generating shape data for electronic designs | Physics | 0 | Active |
| US11921420B2 | Method and system for reticle enhancement technology | Physics | 0 | Active |
| US12045996B2 | Methods and systems for registering images for electronic designs | Physics | 0 | Active |
| US12340495B2 | Method for computational metrology and inspection for patterns to be manufactured on a substrate | Physics | 0 | Active |
| US11823423B2 | Methods and systems for compressing shape data for electronic designs | Physics | 0 | Active |
| US11264206B2 | Methods and systems for forming a pattern on a surface using multi-beam charged particle beam lithography | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.