Andrew Ferko
4Patents
2h-index
10Co-inventors
37Inventor score
Filing activity: Jan 23, 2001 → Aug 26, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6782501B2 | System for reducing test data volume in the testing of logic products | Physics | 17 | Expired |
| US8209141B2 | System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count | Physics | 7 | Active |
| US7103816B2 | Method and system for reducing test data volume in the testing of logic products | Physics | 2 | Expired |
| US7900112B2 | System and method for digital logic testing | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.