Annie Tissier
8Patents
3h-index
10Co-inventors
50Inventor score
Filing activity: Aug 26, 1987 → Dec 22, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5103104A | Process for measuring the dimensions of a spacer | Physics | 12 | Expired |
| US5437948A | Process for adjusting a photolithographic exposure machine and associated device | Physics | 7 | Expired |
| US4813781A | Method of measuring the flowing of a material | Physics | 3 | Expired |
| US6707134B1 | Semiconductor structure having an improved pre-metal dielectric stack and method for forming the same | Electricity | 3 | Expired |
| US5043236A | Process for determining the focussing of a photolithographic apparatus | Physics | 2 | Expired |
| US5186040A | Method for measuring the viscosity of a material | Physics | 1 | Expired |
| US5186786A | Method for determining the complete elimination of a thin layer on a non planar substrate | Electricity | 1 | Expired |
| US6861352B2 | Semiconductor structure having an improved pre-metal dielectric stack and method for forming the same | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.