Inventor · Eindhoven, NL

Bart Jozef Janssen

23Patents
2h-index
32Co-inventors
53Inventor score

Filing activity: Oct 5, 2012 → Jul 24, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US8766214B2 Method of preparing and imaging a lamella in a particle-optical apparatus Electricity 3 Active
US8817148B2 Method for acquiring data with an image sensor Electricity 2 Active
US10937625B2 Method of imaging a sample using an electron microscope Electricity 2 Active
US10014158B1 Innovative image processing in charged particle microscopy Electricity 2 Active
US10825647B2 Innovative imaging technique in transmission charged particle microscopy Electricity 1 Active
US11756762B2 Rotating sample holder for random angle sampling in tomography Electricity 1 Active
US10122946B2 Method for detecting particulate radiation Electricity 1 Active
US11257656B2 Rotating sample holder for random angle sampling in tomography Electricity 1 Active
US9202670B2 Method of investigating the wavefront of a charged-particle beam Electricity 1 Active
US11417498B2 Method of manufacturing a charged particle detector Electricity 1 Active
US10403470B2 Pulse processing Electricity 0 Active
US11990315B2 Measurement and correction of optical aberrations in charged particle beam microscopy Electricity 0 Active
US12074007B2 Rotating sample holder for random angle sampling in tomography Electricity 0 Active
US12009176B2 Method and system for generating a diffraction image Electricity 0 Active
US10692691B2 Pulse processing Electricity 0 Active
US11742175B2 Defective pixel management in charged particle microscopy Electricity 0 Active
US10389955B2 Method for detecting particulate radiation Electricity 0 Active
US11297276B1 Method and system for high speed signal processing Electricity 0 Active
US10008363B2 Method of imaging a specimen using ptychography Electricity 0 Active
US12165835B2 Stroboscopic illumination synchronized electron detection and imaging Electricity 0 Active
US10665419B2 Intelligent pre-scan in scanning transmission charged particle microscopy Electricity 0 Active
US11694874B2 Method and system for generating a diffraction image Electricity 0 Active
US11551906B1 Time-gated detection, dual-layer SPAD-based electron detection Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.