Christophe Wouters
10Patents
2h-index
12Co-inventors
47Inventor score
Filing activity: Apr 12, 2011 → Dec 10, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10935503B2 | Apparatus, method and computer program product for defect detection in work pieces | Physics | 3 | Active |
| US10324044B2 | Apparatus, method and computer program product for defect detection in work pieces | Physics | 2 | Active |
| US11726126B2 | Apparatus, method and computer program product for defect detection in work pieces | Physics | 1 | Active |
| US9778192B2 | Object carrier, system and method for back light inspection | Physics | 1 | Active |
| US9140546B2 | Apparatus and method for three dimensional inspection of wafer saw marks | Physics | 1 | Active |
| US11892493B2 | Apparatus, method and computer program product for defect detection in work pieces | Physics | 0 | Active |
| US9103665B2 | Apparatus and method for three dimensional inspection of wafer saw marks | General | 0 | Revoked |
| US10866092B2 | Chromatic confocal area sensor | Physics | 0 | Active |
| US11105839B2 | Apparatus, method and computer program product for defect detection in work pieces | Physics | 0 | Active |
| US11340284B2 | Combined transmitted and reflected light imaging of internal cracks in semiconductor devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.