Dan Trock
6Patents
2h-index
12Co-inventors
40Inventor score
Filing activity: Jun 30, 2016 → Dec 3, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9983262B1 | Built-in self test controller for a random number generator core | Physics | 4 | Active |
| US10955472B1 | Yield-oriented design-for-test in power-switchable cores | Physics | 3 | Active |
| US9774317B1 | Bistable-element for random number generation | Emerging Cross-Sectional Technologies | 1 | Active |
| US11567130B1 | Input/output voltage testing with boundary scan bypass | Physics | 1 | Active |
| US10990739B1 | Scan channel fabric for tiled circuit designs | Electricity | 0 | Active |
| US10187044B1 | Bistable-element for random number generation | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.