Daniel G. Patterson
14Patents
7h-index
22Co-inventors
66Inventor score
Filing activity: Apr 28, 1995 → Apr 2, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6028880A | Automatic fluorine control system | Electricity | 135 | Expired |
| US5541731A | Interferometric measurement and alignment technique for laser scanners | Electricity | 64 | Expired |
| US6313434A | Method for creation of inclined microstructures using a scanned laser image | Performing Operations; Transporting | 20 | Expired |
| US8399281B1 | Two beam backside laser dicing of semiconductor films | Emerging Cross-Sectional Technologies | 16 | Active |
| US8728849B1 | Laser cutting through two dissimilar materials separated by a metal foil | Emerging Cross-Sectional Technologies | 10 | Active |
| US5751588A | Multi-wavelength programmable laser processing mechanisms and apparatus utilizing vaporization detection | Electricity | 9 | Expired |
| US8361828B1 | Aligned frontside backside laser dicing of semiconductor films | Performing Operations; Transporting | 7 | Active |
| US8728933B1 | Laser cutting and chemical edge clean for thin-film solar cells | Electricity | 5 | Active |
| US5618454A | Multi-wavelength programmable laser processing mechanisms and apparatus utilizing design data translation system | Electricity | 4 | Expired |
| US5620618A | Multi-wavelength programmable laser processing mechanisms and apparatus | Electricity | 2 | Expired |
| US5626778A | Multi-wavelength programmable laser processing mechanisms and apparatus utilizing spectrometer verification | Electricity | 2 | Expired |
| US9859162B2 | Perforation of films for separation | Electricity | 0 | Active |
| US11271121B2 | Laser-textured thin-film semiconductors by melting and ablation | General | 0 | Revoked |
| US11393938B2 | Laser-textured thin-film semiconductors by melting and ablation | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.