Daniel L. Cavan
11Patents
6h-index
17Co-inventors
63Inventor score
Filing activity: May 20, 1985 → Mar 17, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4806774A | Inspection system for array of microcircuit dies having redundant circuit patterns | Physics | 91 | Expired |
| USRE33956E | Inspection system for array of microcircuit dies having redundant circuit patterns | General | 28 | Expired |
| US4811409A | Method and apparatus for detecting defect information in a holographic image pattern | Physics | 24 | Expired |
| US7227984B2 | Method and apparatus for identifying defects in a substrate surface by using dithering to reconstruct under-sampled images | Physics | 22 | Expired |
| US4659172A | Rotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatus | Physics | 13 | Expired |
| US4788431A | Specimen distance measuring system | Electricity | 12 | Expired |
| US6316164A | Proximity effect correction method through uniform removal of fraction of interior pixels | Emerging Cross-Sectional Technologies | 4 | Expired |
| US8643835B2 | Active planar autofocus | Physics | 4 | Active |
| US9128064B2 | Super resolution inspection system | Physics | 1 | Active |
| US9703207B1 | System and method for reducing dynamic range in images of patterned regions of semiconductor wafers | Physics | 1 | Active |
| US10429319B2 | Inspection system including parallel imaging paths with multiple and selectable spectral bands | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.