Inventor · Herzliya, IL

Daniel Ravid

5Patents

2h-index

9Co-inventors

36Inventor score

Filing activity: Jul 29, 2014 → Nov 8, 2021

Most-cited inventions

Patent	Title	Area	Cited by	Status
US11205119B2	Method of deep learning-based examination of a semiconductor specimen and system thereof	Physics	4	Active
US11348001B2	Method of deep learning-based examination of a semiconductor specimen and system thereof	Physics	2	Active
US9715724B2	Registration of CAD data with SEM images	Physics	2	Active
US11010665B2	Method of deep learning-based examination of a semiconductor specimen and system thereof	Physics	2	Active
US12183066B2	Method of deep learning-based examination of a semiconductor specimen and system thereof	Physics	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.