Daniel Wayne Levesque, JR.
13Patents
6h-index
32Co-inventors
66Inventor score
Filing activity: Sep 15, 1993 → Nov 2, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6057927A | Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances for measuring anisotropy, thickness, and other properties | Physics | 212 | Expired |
| US6128092A | Method and system for high resolution ultrasonic imaging of small defects or anomalies. | Physics | 29 | Expired |
| US7353709B2 | Method and system for determining material properties using ultrasonic attenuation | Physics | 21 | Active |
| US5408881A | High resolution ultrasonic interferometry for quantitative mondestructive characterization of interfacial adhesion in multilayer composites | Physics | 20 | Expired |
| US6532821B2 | Apparatus and method for evaluating the physical properties of a sample using ultrasonics | Physics | 19 | Expired |
| US6397680B1 | Ultrasonic spectroscopy apparatus for determining thickness and other properties of multilayer structures | Physics | 11 | Expired |
| US10077206B2 | Methods of etching glass substrates and glass substrates | Emerging Cross-Sectional Technologies | 4 | Active |
| US10134657B2 | Inorganic wafer having through-holes attached to semiconductor wafer | Electricity | 2 | Active |
| US10366904B2 | Articles having holes with morphology attributes and methods for fabricating the same | Electricity | 2 | Active |
| US10424606B1 | Systems and methods for reducing substrate surface disruption during via formation | Electricity | 1 | Active |
| US7988763B2 | Use of a binary salt flux of NaCl and MgCl2 for the purification of aluminium or aluminium alloys, and method thereof | Chemistry; Metallurgy | 0 | Active |
| US10756003B2 | Inorganic wafer having through-holes attached to semiconductor wafer | Electricity | 0 | Active |
| US11608291B2 | Micro-perforated panel systems, applications, and methods of making micro-perforated panel systems | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.