David Crow
7Patents
5h-index
10Co-inventors
56Inventor score
Filing activity: Dec 2, 1998 → Jun 28, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6121156A | Contact monitor, method of forming same and method of analyzing contact-, via-and/or trench-forming processes in an integrated circuit | Electricity | 19 | Expired |
| US6912435B2 | Methods and systems for controlling reticle-induced errors | Emerging Cross-Sectional Technologies | 8 | Expired |
| US7957826B2 | Methods for normalizing error in photolithographic processes | Physics | 8 | Active |
| US6700950B1 | Methods and systems for controlling critical dimension (CD) error | Physics | 6 | Expired |
| US6518591B1 | Contact monitor, method of forming same and method of analizing contact-, via- and/or trench-forming processes in an integrated circuit | Electricity | 6 | Expired |
| US7089528B2 | Methods and systems for estimating reticle bias states | Physics | 1 | Expired |
| US9996854B2 | Hierarchical systems, apparatus and methods for displaying context-aware content | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.