Inventor · Burnsville, MN, US

David DeKraker

14Patents
3h-index
9Co-inventors
45Inventor score

Filing activity: Jun 20, 2007 → Feb 15, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US7819984B2 Process for treatment of substrates with water vapor or steam Electricity 13 Active
US7913706B2 Rinsing methodologies for barrier plate and venturi containment systems in tools used to process microelectronic workpieces with one or more treatment fluids, and related apparatuses Electricity 12 Active
US8387635B2 Barrier structure and nozzle device for use in tools used to process microelectronic workpieces with one or more treatment fluids Electricity 8 Active
US9831107B2 Processing system and method for providing a heated etching solution Electricity 3 Active
US9412639B2 Method of using separate wafer contacts during wafer processing Electricity 2 Active
US9412628B2 Acid treatment strategies useful to fabricate microelectronic devices and precursors thereof Electricity 1 Active
US8142571B2 Process for treatment of semiconductor wafer using water vapor containing environment Electricity 1 Active
US9666456B2 Method and apparatus for treating a workpiece with arrays of nozzles Electricity 1 Active
US8967167B2 Barrier structure and nozzle device for use in tools used to process microelectronic workpieces with one or more treatment fluids Electricity 0 Active
US9887107B2 Methodologies for rinsing tool surfaces in tools used to process microelectronic workpieces Performing Operations; Transporting 0 Active
US8668778B2 Method of removing liquid from a barrier structure Electricity 0 Active
US8920577B2 Process for treatment of substrates with water vapor or steam Electricity 0 Active
US8978675B2 Method and apparatus for treating a workpiece with arrays of nozzles Electricity 0 Active
US9263303B2 Methodologies for rinsing tool surfaces in tools used to process microelectronic workpieces Performing Operations; Transporting 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.