David Owen
10Patents
4h-index
7Co-inventors
53Inventor score
Filing activity: Oct 26, 1995 → Nov 29, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6469788B2 | Coherent gradient sensing ellipsometer | Physics | 31 | Expired |
| USD390104S | Container for a potato or other vegetable | General | 26 | Expired |
| US7433051B2 | Determination of lithography misalignment based on curvature and stress mapping data of substrates | Electricity | 15 | Active |
| US5942086A | Application of material to a substrate | Textiles; Paper | 6 | Expired |
| US7369251B2 | Full-field optical measurements of surface properties of panels, substrates and wafers | Physics | 4 | Expired |
| US8398849B2 | Application of visbreaker analysis tools to optimize performance | Physics | 3 | Active |
| US5685952A | Deinking of paper using magnetic forces | Emerging Cross-Sectional Technologies | 3 | Expired |
| US9935022B2 | Systems and methods of characterizing process-induced wafer shape for process control using CGS interferometry | Electricity | 2 | Active |
| US7517458B2 | Process obtaining landfill disposable wasted from hydrocarbon containing sludge | Chemistry; Metallurgy | 1 | Expired |
| US8765493B2 | Methods of characterizing semiconductor light-emitting devices based on product wafer characteristics | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.