David S. Zuck
13Patents
5h-index
3Co-inventors
51Inventor score
Filing activity: Feb 15, 2000 → Feb 12, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6637444B1 | Volume efficient cleaning methods | Emerging Cross-Sectional Technologies | 9 | Expired |
| US6530388B1 | Volume efficient cleaning systems | Emerging Cross-Sectional Technologies | 8 | Expired |
| US6926016B1 | System for removing contaminants from semiconductor process equipment | Emerging Cross-Sectional Technologies | 7 | Expired |
| US7328712B1 | Cleaning bench for removing contaminants from semiconductor process equipment | Emerging Cross-Sectional Technologies | 6 | Expired |
| US7427330B1 | Cleaning bench for removing contaminants from semiconductor process equipment | Emerging Cross-Sectional Technologies | 5 | Active |
| US7624742B1 | Method for removing aluminum fluoride contamination from aluminum-containing surfaces of semiconductor process equipment | Chemistry; Metallurgy | 4 | Active |
| US6648982B1 | Steam cleaning system and method for semiconductor process equipment | Emerging Cross-Sectional Technologies | 3 | Expired |
| US7541094B1 | Firepolished quartz parts for use in semiconductor processing | Emerging Cross-Sectional Technologies | 3 | Active |
| US6936114B1 | Steam cleaning system and method for semiconductor process equipment | Emerging Cross-Sectional Technologies | 1 | Expired |
| US7108002B1 | Steam cleaning system and method for semiconductor process equipment | Performing Operations; Transporting | 0 | Expired |
| US7073522B2 | Apparatus for applying disparate etching solutions to interior and exterior surfaces | Emerging Cross-Sectional Technologies | 0 | Expired |
| US7267132B2 | Methods for removing silicon and silicon-nitride contamination layers from deposition tubes | Emerging Cross-Sectional Technologies | 0 | Expired |
| US7448397B1 | Apparatus for applying disparate etching solutions to interior and exterior surfaces | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.