David Scheiner
29Patents
11h-index
20Co-inventors
75Inventor score
Filing activity: Jun 13, 1983 → Aug 30, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6476920B1 | Method and apparatus for measurements of patterned structures | Electricity | 100 | Expired |
| US6100985A | Method and apparatus for measurements of patterned structures | Electricity | 70 | Expired |
| US6974962B2 | Lateral shift measurement using an optical technique | Electricity | 70 | Expired |
| US6556947B1 | Optical measurements of patterned structures | Electricity | 49 | Expired |
| US6281974A | Method and apparatus for measurements of patterned structures | Electricity | 39 | Expired |
| US6292265A | Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects | Electricity | 27 | Expired |
| US6815947B2 | Method and system for thickness measurements of thin conductive layers | Physics | 24 | Expired |
| US7292341B2 | Optical system operating with variable angle of incidence | Physics | 23 | Expired |
| US8531679B2 | Optical system and method for measurement of one or more parameters of via-holes | Electricity | 19 | Active |
| US9140539B2 | Optical system and method for measurement of one or more parameters of via-holes | Electricity | 17 | Active |
| US6940609B2 | Method and system for measuring the topography of a sample | Physics | 11 | Expired |
| US6801315B2 | Method and system for overlay measurement | Physics | 8 | Expired |
| US7187456B2 | Method and apparatus for measurements of patterned structures | Electricity | 7 | Expired |
| US6801326B2 | Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects | Electricity | 7 | Expired |
| US4500552A | Gelatin dessert product | Human Necessities | 6 | Expired |
| US7123366B2 | Method and apparatus for measurements of patterned structures | Electricity | 6 | Expired |
| US6836324B2 | Method and apparatus for measurements of patterned structures | Electricity | 4 | Expired |
| US7253970B2 | Reflective optical system | Physics | 4 | Expired |
| US6885446B2 | Method and system for monitoring a process of material removal from the surface of a patterned structure | Physics | 3 | Expired |
| US7532414B2 | Reflective optical system | Physics | 2 | Active |
| US10316419B2 | System for utilizing excess heat for carrying out electrochemical reactions | Emerging Cross-Sectional Technologies | 0 | Active |
| US12053817B2 | Sand molding for metal additive casting | Emerging Cross-Sectional Technologies | 0 | Active |
| US11766715B2 | Sand molding for metal additive casting | Emerging Cross-Sectional Technologies | 0 | Active |
| US10072344B2 | Device and apparatus for carrying out chemical dissociation reactions at elevated temperatures | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US9785059B2 | Lateral shift measurement using an optical technique | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.