David Stashower
8Patents
7h-index
14Co-inventors
52Inventor score
Filing activity: Mar 12, 2002 → May 13, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6795952B1 | System and method for product yield prediction using device and process neighborhood characterization vehicle | Electricity | 235 | Expired |
| US6901564B2 | System and method for product yield prediction | Electricity | 127 | Expired |
| US7174521B2 | System and method for product yield prediction | Electricity | 20 | Expired |
| US7024642B2 | Extraction method of defect density and size distributions | Electricity | 10 | Expired |
| US7356800B2 | System and method for product yield prediction | Electricity | 8 | Active |
| US8362480B1 | Reusable test chip for inline probing of three dimensionally arranged experiments | Electricity | 8 | Active |
| US7373625B2 | System and method for product yield prediction | Electricity | 7 | Active |
| US7673262B2 | System and method for product yield prediction | Electricity | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.