Eric M. Coker
6Patents
4h-index
15Co-inventors
46Inventor score
Filing activity: Jun 1, 2001 → Aug 29, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7224063B2 | Dual-damascene metallization interconnection | Electricity | 22 | Expired |
| US7382055B2 | Integrated thin-film resistor with direct contact | Electricity | 6 | Active |
| US7470613B2 | Dual damascene multi-level metallization | Electricity | 5 | Active |
| US7303972B2 | Integrated thin-film resistor with direct contact | Electricity | 4 | Expired |
| US6760901B2 | Trough adjusted optical proximity correction for vias | Electricity | 1 | Expired |
| US7494748B2 | Method for correction of defects in lithography masks | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.