Hideo Azumai
15Patents
9h-index
20Co-inventors
64Inventor score
Filing activity: Jul 26, 1988 → Jan 24, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5764816A | Image forming apparatus capable of converting the resolution | Electricity | 93 | Expired |
| US4855803A | Selectively definable semiconductor device | Electricity | 42 | Expired |
| US5565767A | Base substrate of multichip module and method for inspecting the same | Physics | 22 | Expired |
| US4977414A | Image forming apparatus | Physics | 20 | Expired |
| US5107278A | Image forming apparatus | Electricity | 14 | Expired |
| US5019913A | Recording apparatus having control data selectively designated in memory which corresponds to one of multiple optical scanning systems | Electricity | 14 | Expired |
| US5659402A | Image processing method and apparatus | Electricity | 14 | Expired |
| US5349449A | Image data processing circuit and method of accessing storing means for the processing circuit | Electricity | 10 | Expired |
| US5519509A | Image processing method utilizing error diffusion technique | Electricity | 9 | Expired |
| US5572337A | Shading correcting method and shading correcting apparatus | Electricity | 8 | Expired |
| US5532827A | Apparatus for reproducing image densities using pixel processing and method of use thereof | Electricity | 7 | Expired |
| US5541505A | Testing integrated circuits by consolidating a plurality of digital signals as a multilevel signal | Physics | 6 | Expired |
| US5198757A | Method and apparatus for testing semiconductor integrated circuit | Physics | 6 | Expired |
| US5646745A | Image data processing apparatus having line memory | Electricity | 3 | Expired |
| US5706102A | Data managing device in image variable magnification processing apparatus | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.