Hyosig Won
7Patents
2h-index
19Co-inventors
40Inventor score
Filing activity: Jul 23, 2013 → Feb 25, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10026661B2 | Semiconductor device for testing large number of devices and composing method and test method thereof | Physics | 6 | Active |
| US9496179B2 | Method of manufacturing semiconductor devices | Electricity | 4 | Active |
| US9459680B2 | System on chip and temperature control method thereof | Emerging Cross-Sectional Technologies | 2 | Active |
| US10248752B2 | Method for routing between pins of semiconductor device and design system therewith | Physics | 2 | Active |
| US9536946B2 | Semiconductor device and method for manufacturing the same | Electricity | 2 | Active |
| US10509884B2 | Method for routing between pins of semiconductor device and design system therewith | Physics | 0 | Active |
| US9652580B2 | Integrated circuit layout design system and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.