Inventor · Delft, NL

Jacob Klinkhamer

7Patents
2h-index
23Co-inventors
47Inventor score

Filing activity: Dec 29, 2003 → May 2, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US6955074B2 Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby Emerging Cross-Sectional Technologies 4 Expired
US8164740B2 Illumination system coherence remover with two sets of stepped mirrors Physics 2 Active
US7781237B2 Alignment marker and lithographic apparatus and device manufacturing method using the same Physics 1 Expired
US7609362B2 Scanning lithographic apparatus and device manufacturing method Physics 1 Active
US7480028B2 Lithographic apparatus for imaging a front side or a back side of a substrate, method of substrate identification, device manufacturing method, substrate, and computer program Physics 1 Expired
US8159651B2 Illumination system coherence remover with a series of partially reflective surfaces Physics 0 Active
US11360403B2 Bandwidth calculation system and method for determining a desired wavelength bandwidth for a measurement beam in a mark detection system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.