James Breisch
14Patents
7h-index
14Co-inventors
55Inventor score
Filing activity: Feb 27, 1998 → Sep 16, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6396539B1 | CMOS imaging device with integrated defective pixel correction circuitry | Electricity | 48 | Expired |
| US7024565B1 | Method and apparatus to detect circuit tampering | Electricity | 16 | Expired |
| US6293465A | CMOS imaging device with integrated identification circuitry | Electricity | 13 | Expired |
| US6091093A | Photodiode having transparent insulating film around gate islands above p-n junction | Electricity | 9 | Expired |
| US6806569B2 | Multi-frequency power delivery system | Electricity | 9 | Expired |
| US7109569B2 | Dual referenced microstrip | Electricity | 8 | Expired |
| US6306679A | Photodiode having transparent insulating film around gate islands above P-N junction | Electricity | 7 | Expired |
| US6697112B2 | Imaging system having multiple image capture modes | Electricity | 7 | Expired |
| US6410359B1 | Reduced leakage trench isolation | Electricity | 6 | Expired |
| US6215165A | Reduced leakage trench isolation | Electricity | 5 | Expired |
| US6259145A | Reduced leakage trench isolation | Electricity | 4 | Expired |
| US6362695B1 | Method and apparatus to produce a random bit sequence | Electricity | 3 | Expired |
| US6686819B2 | Dual referenced microstrip | Electricity | 0 | Expired |
| US6403394B2 | Reduced leakage trench isolation | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.