Jason Osborne
8Patents
2h-index
14Co-inventors
44Inventor score
Filing activity: May 19, 2005 → Jul 8, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7665349B2 | Method and apparatus for rapid automatic engagement of a probe | Performing Operations; Transporting | 4 | Expired |
| US7429732B2 | Scanning probe microscopy method and apparatus utilizing sample pitch | Emerging Cross-Sectional Technologies | 2 | Expired |
| US10969406B2 | High speed atomic force profilometry of large areas | Physics | 1 | Active |
| US9995763B2 | Precise probe placement in automated scanning probe microscopy systems | Physics | 0 | Active |
| US11714104B2 | AFM imaging with creep correction | Physics | 0 | Active |
| US11796565B2 | AFM imaging with metrology-preserving real time denoising | Physics | 0 | Active |
| US11668730B2 | High speed atomic force profilometry of large areas | Physics | 0 | Active |
| US11604210B2 | AFM imaging with real time drift correction | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.