Jeanne Luce
16Patents
4h-index
20Co-inventors
60Inventor score
Filing activity: Mar 28, 1998 → Jan 12, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6079353A | Chamber for reducing contamination during chemical vapor deposition | Chemistry; Metallurgy | 32 | Expired |
| US6114227A | Chamber for reducing contamination during chemical vapor deposition | Chemistry; Metallurgy | 23 | Expired |
| US10734379B2 | Fin end plug structures for advanced integrated circuit structure fabrication | Electricity | 8 | Active |
| US9406547B2 | Techniques for trench isolation using flowable dielectric materials | Electricity | 5 | Active |
| US10147634B2 | Techniques for trench isolation using flowable dielectric materials | Electricity | 3 | Active |
| US11380683B2 | Fin end plug structures for advanced integrated circuit structure fabrication | Electricity | 2 | Active |
| US10861850B2 | Fin end plug structures for advanced integrated circuit structure fabrication | Electricity | 2 | Active |
| US9087915B2 | Interlayer dielectric for non-planar transistors | Electricity | 1 | Active |
| US10056488B2 | Interlayer dielectric for non-planar transistors | Electricity | 1 | Active |
| US11961838B2 | Fin end plug structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US10693006B2 | Interlayer dielectric for non-planar transistors | Electricity | 0 | Active |
| US10964800B2 | Semiconductor device having fin-end stress-inducing features | Electricity | 0 | Active |
| US12284826B2 | Fin end plug structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US10998445B2 | Interlayer dielectric for non-planar transistors | Electricity | 0 | Active |
| US10811251B2 | Dielectric gap-fill material deposition | Electricity | 0 | Active |
| US9634124B2 | Interlayer dielectric for non-planar transistors | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.