John Mendonca
15Patents
10h-index
22Co-inventors
72Inventor score
Filing activity: Nov 17, 1986 → Jul 30, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8296847B2 | Method of managing utilization of network intrusion detection systems in a dynamic data center | Electricity | 123 | Active |
| US6093966A | Semiconductor device with a copper barrier layer and formation thereof | Electricity | 80 | Expired |
| US5985748A | Method of making a semiconductor device using chemical-mechanical polishing having a combination-step process | Electricity | 50 | Expired |
| US6274478A | Method for forming a copper interconnect using a multi-platen chemical mechanical polishing (CMP) process | Electricity | 36 | Expired |
| US7712133B2 | Integrated intrusion detection system and method | Physics | 34 | Active |
| US6444569B1 | Method for forming a copper interconnect using a multi-platen chemical mechanical polishing (CMP) process | Electricity | 31 | Expired |
| US4737474A | Silicide to silicon bonding process | Emerging Cross-Sectional Technologies | 23 | Expired |
| US4777061A | Blanket tungsten deposition for dielectric | Chemistry; Metallurgy | 22 | Expired |
| US7143121B2 | Method and system for archiving and restoring data from an operations center in a utility data center | Emerging Cross-Sectional Technologies | 17 | Expired |
| US6573173B2 | Method for forming a copper interconnect using a multi-platen chemical mechanical polishing (CMP) process | Electricity | 10 | Expired |
| US7895409B2 | Application inspection tool for determining a security partition | Physics | 10 | Active |
| US4749597A | Process for CVD of tungsten | Electricity | 9 | Expired |
| US7590738B2 | Method and system for processing concurrent events in a provisional network | Physics | 5 | Active |
| US7523503B2 | Method for protecting security of network intrusion detection sensors | Electricity | 3 | Expired |
| US8533828B2 | System for protecting security of a provisionable network | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.