Kenichi Narikawa
6Patents
2h-index
21Co-inventors
51Inventor score
Filing activity: Feb 6, 1974 → Jul 25, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US3950467A | Method for shaping tubular films in downward and wet manner | Performing Operations; Transporting | 6 | Expired |
| US7733113B2 | Semiconductor test device | Physics | 2 | Active |
| US10859601B2 | Device inspection circuit, device inspection device, and probe card | Physics | 1 | Active |
| US11454664B2 | Testing system | Electricity | 0 | Active |
| US11293978B2 | Voltage application device for testing plurality of devices and method of forming output voltage waveform | Physics | 0 | Active |
| US10114070B2 | Substrate inspection apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.