Kimiaki Ando
23Patents
11h-index
52Co-inventors
78Inventor score
Filing activity: May 24, 1983 → Dec 8, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6172363A | Method and apparatus for inspecting integrated circuit pattern | Electricity | 96 | Expired |
| US6329826A | Method and apparatus for inspecting integrated circuit pattern | Electricity | 56 | Expired |
| US5999409A | Contactless IC card | Electricity | 32 | Expired |
| US4820928A | Lithography apparatus | Electricity | 22 | Expired |
| US6352202B2 | Method and system for controlling contactless IC cards | Physics | 14 | Expired |
| US7417444B2 | Method and apparatus for inspecting integrated circuit pattern | Electricity | 13 | Expired |
| US4580236A | Graphic display apparatus with a vector generating circuit | Physics | 12 | Expired |
| US4943729A | Electron beam lithography system | Electricity | 12 | Expired |
| US7026830B2 | Method and apparatus for inspecting integrated circuit pattern | Electricity | 12 | Expired |
| US6559663B2 | Method and apparatus for inspecting integrated circuit pattern | Electricity | 12 | Expired |
| US5197097A | Cell signal processing circuit and optical switch apparatus using the same | Electricity | 11 | Expired |
| US6373708B1 | Contactless IC card | Electricity | 11 | Expired |
| US4758973A | Apparatus for processing floating-point data having exponents of a variable length | Electricity | 6 | Expired |
| US7952074B2 | Method and apparatus for inspecting integrated circuit pattern | Electricity | 6 | Active |
| US6977956B2 | Pilot signal reception method and receiver | Electricity | 2 | Expired |
| US7635851B2 | Electron beam apparatus and method of generating an electron beam irradiation pattern | Electricity | 2 | Active |
| US6403973B1 | Electron beam exposure method and apparatus and semiconductor device manufactured using the same | Electricity | 2 | Expired |
| US7313173B2 | Correlation detection method and apparatus, transmission diversity detection method and apparatus, each method and apparatus for detection within a small time unit | Electricity | 1 | Expired |
| US7608844B2 | Charged particle beam drawing apparatus | Electricity | 1 | Expired |
| US8937714B2 | Inspecting apparatus and inspecting method | Electricity | 0 | Active |
| US6525519B2 | Amplitude detecting circuit | Electricity | 0 | Expired |
| US7643462B2 | Selective storing order method in CDMA receiver | Electricity | 0 | Expired |
| US8008622B2 | Electron beam apparatus and method of generating an electron beam irradiation pattern | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.