Inventor · Kawasaki, JP

Masataka Shiratsuchi

41Patents
7h-index
47Co-inventors
69Inventor score

Filing activity: Sep 29, 1995 → Oct 31, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US5995303A Optical element and optical device Physics 54 Expired
US7648256B2 Lighting system having lenses for light sources emitting rays at different wavelengths Electricity 39 Active
US7663769B2 Sheet thickness measuring device and image forming apparatus Physics 36 Active
US6421451B2 Step difference detection apparatus and processing apparatus using the same Physics 27 Expired
US8696184B2 Surface light source device Physics 14 Active
US10180529B2 Illumination device and light-guiding member Physics 9 Active
US8396384B2 Apparatus and method of determining the type of paper sheet, and image formation apparatus Performing Operations; Transporting 9 Active
US6344928B1 Display device Electricity 5 Expired
US8305863B2 Optical information recording apparatus Physics 5 Active
US9281328B2 Image sensor that includes a boundary region formed between a logic circuit region and an image-sensing element region and manufacturing method thereof Electricity 3 Active
US10041892B2 Charged particle beam inspection apparatus and charged particle beam inspection method Electricity 2 Active
US9194568B2 Lighting unit and lighting device Emerging Cross-Sectional Technologies 2 Active
US8797607B2 Method and apparatus for deciding recording media based on light from a linear light source that passes a slit in a light shielding portion Performing Operations; Transporting 2 Active
US10997713B2 Inspection device, inspection method, and storage medium Physics 2 Active
US8004655B2 Automatic focus adjusting mechanism and optical image acquisition apparatus Physics 2 Active
US9442239B2 Illuminating device Physics 1 Active
US9436001B2 Light beam scanner Physics 1 Active
US8437236B2 Optical information recording/reproducing apparatus and method Physics 1 Active
US10762383B2 Pattern inspection apparatus and pattern inspection method Physics 1 Active
US11101103B2 Multiple electron beam inspection apparatus and multiple electron beam inspection method Electricity 1 Active
US10984978B2 Multiple electron beam inspection apparatus and multiple electron beam inspection method Electricity 1 Active
US10712295B2 Electron beam inspection apparatus and electron beam inspection method Electricity 1 Active
US10775326B2 Electron beam inspection apparatus and electron beam inspection method Electricity 1 Active
US7618161B2 Fresnel lens and lighting apparatus provided with the Fresnel lens Mechanical Engineering; Lighting; Heating 1 Expired
US11417495B2 Multi-charged particle beam irradiation apparatus and multi-charged particle beam inspection apparatus Electricity 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.