Inventor · Weinheim, DE

Michael Hübner

13Patents
4h-index
28Co-inventors
60Inventor score

Filing activity: Jul 18, 1977 → Apr 20, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US6762611B2 Test configuration and test method for testing a plurality of integrated circuits in parallel Physics 9 Expired
US6853206B2 Method and probe card configuration for testing a plurality of integrated circuits in parallel Physics 5 Expired
US4248790A Gona-4,9(10)-dienes and process of producing the same Chemistry; Metallurgy 5 Expired
US6867479B2 Method for rewiring pads in a wafer-level package Electricity 5 Expired
US8612920B2 Field device for determining or monitoring a physical or chemical variable Physics 4 Active
US6970006B2 Apparatus for the automated testing, calibration and characterization of test adapters Physics 3 Expired
US4167517A Gona-4,9(10)-dienes and process of producing the same Chemistry; Metallurgy 2 Expired
US8712727B2 Field device for determining or monitoring a physical or chemical process variable Physics 1 Active
US9964555B2 Field device for determining or monitoring a physical or chemical process variable in automation technology Electricity 0 Active
US9873646B2 Process for preparing cyclohexane from benzene and methylcyclopentane with upstream benzene hydrogenation Chemistry; Metallurgy 0 Active
US10137386B2 Separation of ionic liquids in coalescing devices Chemistry; Metallurgy 0 Active
US6773934B2 Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer Physics 0 Expired
US10815168B2 Chemical conversion process in a dispersion Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.