Michael Ricchetti
9Patents
5h-index
5Co-inventors
52Inventor score
Filing activity: Nov 20, 2000 → Jul 23, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6988232B2 | Method and apparatus for optimized parallel testing and access of electronic circuits | Physics | 113 | Expired |
| US6594802B1 | Method and apparatus for providing optimized access to circuits for debug, programming, and test | Physics | 89 | Expired |
| US6957371B2 | Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems | Physics | 27 | Expired |
| US7574637B2 | Method and apparatus for optimized parallel testing and access of electronic circuits | Physics | 18 | Active |
| US7467342B2 | Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems | Physics | 8 | Active |
| US7406638B2 | System and method for optimized test and configuration throughput of electronic circuits | Physics | 2 | Expired |
| US9344075B2 | Measuring delay between signal edges of different signals using an undersampling clock | Electricity | 1 | Active |
| US9152749B2 | Management system, method and apparatus for licensed delivery and accounting of electronic circuits | Physics | 0 | Active |
| US8443331B2 | Synchronizing TAP controller after power is restored | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.