Inventor · Tokyo, JP

Mieko Suzuki

15Patents
7h-index
10Co-inventors
63Inventor score

Filing activity: Sep 22, 1983 → Mar 28, 2005

Most-cited inventions

PatentTitleAreaCited byStatus
US5420075A Forming multi-layered interconnections with fluorine compound treatment permitting selective deposition of insulator Emerging Cross-Sectional Technologies 274 Expired
US5607880A Method of fabricating multilevel interconnections in a semiconductor integrated circuit Electricity 30 Expired
US5332694A Process for manufacturing a semiconductor device Electricity 21 Expired
US4552633A Fine particulate for use in clinical testing and a process for producing thereof Chemistry; Metallurgy 17 Expired
US6361708B1 Method and apparatus for polishing a metal film Electricity 10 Expired
US5491108A Method of producing semiconductor integrated circuit device having interplayer insulating film covering substrate Electricity 9 Expired
US6551914B1 Method of forming polish stop by plasma treatment for interconnection Electricity 8 Expired
US6235071A Chemical mechanical polishing method for highly accurate in-plane uniformity in polishing rate over position Electricity 7 Expired
US5904558A Fabrication process of semiconductor device Electricity 7 Expired
US6054383A Fabrication method of semiconductor device Electricity 6 Expired
US6783446B1 Chemical mechanical polishing apparatus and method of chemical mechanical polishing Performing Operations; Transporting 2 Expired
US7123336B2 Twisted nematic liquid crystal material with certain values for dielectric constant anisotropy, twisted elasticity modulus and refractive index anisotropy Chemistry; Metallurgy 1 Expired
US6110014A Method and apparatus polishing wafer for extended effective area of wafer Performing Operations; Transporting 0 Expired
US7167229B2 Liquid crystal display element and projection display device Chemistry; Metallurgy 0 Expired
US6951512B2 Chemical mechanical polishing apparatus and method of chemical mechanical polishing Performing Operations; Transporting 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.