Naoki Ikeuchi
13Patents
6h-index
16Co-inventors
59Inventor score
Filing activity: May 27, 1998 → Dec 5, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6223601A | Vibration wave detecting method and vibration wave detector | Physics | 22 | Expired |
| US6438243B1 | Vibration wave detector | Electricity | 20 | Expired |
| US8141426B2 | Displacement measurement apparatus for microstructure and displcement measurement method thereof | Physics | 8 | Active |
| US7428841B2 | Acceleration sensor and inclination-detecting method | Physics | 8 | Expired |
| US6931928B2 | Microstructure with movable mass | Physics | 8 | Expired |
| US7383732B2 | Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure | Physics | 6 | Expired |
| US7005865B2 | Circuit and method for impedance detection | Physics | 6 | Expired |
| US7726190B2 | Device, method and program for inspecting microstructure | Physics | 5 | Active |
| US8082124B2 | Method and system for diagnosing abnormal plasma discharge | Electricity | 3 | Active |
| US7348788B2 | Probing card and inspection apparatus for microstructure | Performing Operations; Transporting | 3 | Expired |
| US7019540B2 | Electrostatic capacitance detection circuit and microphone device | Physics | 3 | Expired |
| US7034551B2 | Electrostatic capacitance detection circuit and microphone device | Physics | 2 | Expired |
| US7023223B2 | Impedance measuring circuit and capacitance measuring circuit | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.