Olivier Nier
5Patents
1h-index
4Co-inventors
30Inventor score
Filing activity: Aug 4, 2014 → Oct 28, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9318372B2 | Method of stressing a semiconductor layer | Electricity | 1 | Active |
| US9331175B2 | Method of locally stressing a semiconductor layer | Electricity | 1 | Active |
| US9305828B2 | Method of forming stressed SOI layer | Electricity | 1 | Active |
| US9240466B2 | Method of introducing local stress in a semiconductor layer | Electricity | 1 | Active |
| US9543214B2 | Method of forming stressed semiconductor layer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.