Pascal Miller
15Patents
8h-index
20Co-inventors
72Inventor score
Filing activity: Nov 25, 1992 → Aug 10, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6509547B1 | Method for laser stripping of optical fiber and flat cable | Performing Operations; Transporting | 64 | Expired |
| US5389794A | Surface pit and mound detection and discrimination system and method | Physics | 47 | Expired |
| US5610719A | Displacement detection system | Physics | 42 | Expired |
| US5625193A | Optical inspection system and method for detecting flaws on a diffractive surface | Physics | 42 | Expired |
| US5672885A | Surface displacement detection and adjustment system | Physics | 42 | Expired |
| US5717198A | Pellicle reflectivity monitoring system having means for compensating for portions of light reflected by the pellicle | Physics | 21 | Expired |
| US5814829A | Multistation surface inspection system | Physics | 19 | Expired |
| US8772671B2 | Precision laser ablation | Performing Operations; Transporting | 8 | Active |
| US6501045B1 | Method and apparatus for controlling the taper angle of the walls of laser machined features | Performing Operations; Transporting | 8 | Expired |
| US5602401A | Data processing system and method for a surface inspection apparatus | Physics | 7 | Expired |
| US7210820B2 | Methods and apparatuses for homogenizing light | Physics | 4 | Expired |
| US9132585B2 | Laser machining system and method for machining three-dimensional objects from a plurality of directions | Performing Operations; Transporting | 3 | Active |
| US5675409A | Plate holder for a surface inspection system | Physics | 0 | Expired |
| US7812280B2 | Method and apparatus for laser micromachining a conical surface | Performing Operations; Transporting | 0 | Active |
| US9511448B2 | Laser machining system and method for machining three-dimensional objects from a plurality of directions | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.