Paul E. Larson
15Patents
8h-index
16Co-inventors
69Inventor score
Filing activity: Jul 3, 1975 → Mar 13, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6800852B2 | Nondestructive characterization of thin films using measured basis spectra | Electricity | 57 | Expired |
| US6891158B2 | Nondestructive characterization of thin films based on acquired spectrum | Physics | 53 | Expired |
| US5602899A | Anode assembly for generating x-rays and instrument with such anode assembly | Electricity | 43 | Expired |
| US5315113A | Scanning and high resolution x-ray photoelectron spectroscopy and imaging | Electricity | 31 | Expired |
| US5444242A | Scanning and high resolution electron spectroscopy and imaging | Electricity | 26 | Expired |
| US5990476A | Control of surface potential of insulating specimens in surface analysis | Physics | 24 | Expired |
| US5118941A | Apparatus and method for locating target area for electron microanalysis | Electricity | 20 | Expired |
| US4198161A | Low turbidity nephelometer | Physics | 12 | Expired |
| US4329149A | Method for spectrophotometric compensation for colorimetric reagent variation | Physics | 5 | Expired |
| US7449682B2 | System and method for depth profiling and characterization of thin films | Physics | 4 | Expired |
| US9159539B2 | Method and apparatus to provide parallel acquisition of mass spectrometry/mass spectrometry data | Electricity | 2 | Active |
| US8071942B2 | Sample holder apparatus to reduce energy of electrons in an analyzer system and method | Electricity | 2 | Active |
| US3967127A | Sample introducer | Electricity | 2 | Expired |
| US7529858B2 | Hard disk drive controller having versatile chip connector having printed circuit board engaged by at least two data ports having two pairs of differential connector elements | Physics | 0 | Active |
| US7334052B2 | Versatile dual port connector element arrangement | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.