Prashanth Kumar
12Patents
3h-index
16Co-inventors
53Inventor score
Filing activity: Aug 8, 2014 → Jun 28, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10262910B2 | Method of feature exaction from time-series of spectra to control endpoint of process | Electricity | 13 | Active |
| USD977504S1 | Portion of a display panel with a graphical user interface | General | 8 | Active |
| US9183337B1 | Circuit design with predefined configuration of parameterized cores | Physics | 3 | Active |
| US12283503B2 | Substrate measurement subsystem | Emerging Cross-Sectional Technologies | 1 | Active |
| US12061458B2 | Systems and methods for adaptive troubleshooting of semiconductor manufacturing equipment | Physics | 1 | Active |
| US10686665B2 | Discovery and configuration of an open networking adapter in a fabric network | Electricity | 1 | Active |
| US10067642B1 | Dynamic discovery and presentation of core parameters | Physics | 0 | Active |
| US11688616B2 | Integrated substrate measurement system to improve manufacturing process performance | Emerging Cross-Sectional Technologies | 0 | Active |
| US12429846B2 | Systems and methods for adaptive troubleshooting of semiconductor manufacturing equipment | Physics | 0 | Active |
| US12191176B2 | Integrated substrate measurement system to improve manufacturing process performance | Emerging Cross-Sectional Technologies | 0 | Active |
| US10847430B2 | Method of feature exaction from time-series of spectra to control endpoint of process | Electricity | 0 | Active |
| US12136557B2 | Integrated substrate measurement system to improve manufacturing process performance | General | 0 | Revoked |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.