Sho Takami
13Patents
4h-index
18Co-inventors
53Inventor score
Filing activity: Aug 2, 1996 → Oct 19, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6444981B1 | Scanning electron microscope | Electricity | 16 | Expired |
| US6512228B2 | Scanning electron microscope | Electricity | 10 | Expired |
| US7187345B2 | Image forming method and charged particle beam apparatus | Electricity | 7 | Expired |
| US5912462A | Electron microscope | Electricity | 6 | Expired |
| US7817105B2 | Image forming method and charged particle beam apparatus | Electricity | 3 | Active |
| US7030376B2 | Electron beam apparatus and method for production of its specimen chamber | Electricity | 3 | Expired |
| US7091496B2 | Electron microscopic inspection apparatus | Electricity | 2 | Expired |
| US7435958B2 | Electron beam apparatus and method for production of its specimen chamber | Electricity | 2 | Expired |
| US8686380B2 | Charged particle beam apparatus | Electricity | 1 | Active |
| US7795581B2 | Pattern measuring method and electron microscope | Electricity | 1 | Active |
| US7205550B2 | Electron beam apparatus and method for production of its specimen chamber | Electricity | 0 | Active |
| US7566892B2 | Electron beam apparatus and method for production of its specimen chamber | Electricity | 0 | Active |
| US8203504B2 | Image forming method and charged particle beam apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.