Steev Wilcox
10Patents
3h-index
8Co-inventors
45Inventor score
Filing activity: Mar 4, 2015 → Jan 11, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9606179B1 | Method and system for improving efficiency of XOR-based test compression using an embedded serializer-deserializer | Physics | 5 | Active |
| US9470756B1 | Method for using sequential decompression logic for VLSI test in a physically efficient construction | Physics | 5 | Active |
| US9501590B1 | Systems and methods for testing integrated circuit designs | Physics | 4 | Active |
| US9817068B1 | Method and system for improving efficiency of sequential test compression using overscan | Physics | 3 | Active |
| US9513335B1 | Method for using XOR trees for physically efficient scan compression and decompression logic | Physics | 3 | Active |
| US9470754B1 | Elastic compression-optimizing tester bandwidth with compressed test stimuli using overscan and variable serialization | Physics | 3 | Active |
| US9465896B1 | Systems and methods for testing integrated circuit designs | Physics | 3 | Active |
| US9470755B1 | Method for dividing testable logic into a two-dimensional grid for physically efficient scan | Physics | 2 | Active |
| US9817069B1 | Method and system for construction of a highly efficient and predictable sequential test decompression logic | Physics | 1 | Active |
| US11748534B1 | System and method for glitch power estimation | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.