Inventor · San Luis Obispo, CA, US

Stephan Wolf

15Patents
6h-index
18Co-inventors
59Inventor score

Filing activity: Jun 11, 1999 → May 29, 2017

Most-cited inventions

PatentTitleAreaCited byStatus
US6146242A Optical view port for chemical mechanical planarization endpoint detection Performing Operations; Transporting 67 Expired
US9663237B2 Aircraft Emerging Cross-Sectional Technologies 40 Active
US6488568B1 Optical view port for chemical mechanical planarization endpoint detection Performing Operations; Transporting 18 Expired
US6485354B1 Polishing pad with built-in optical sensor Performing Operations; Transporting 13 Expired
US10752372B2 Aircraft Emerging Cross-Sectional Technologies 10 Active
US7052366B2 Endpoint detection system for wafer polishing Performing Operations; Transporting 6 Expired
US7195541B2 Endpoint detection system for wafer polishing Performing Operations; Transporting 4 Active
US9618939B2 Method for controlling an aircraft in the form of a multicopter and corresponding control system Physics 4 Active
US6695681B2 Endpoint detection system for wafer polishing Performing Operations; Transporting 4 Expired
US7074110B1 Optical coupler hub for chemical-mechanical-planarization polishing pads with an integrated optical waveguide Performing Operations; Transporting 2 Expired
US9191881B2 Wireless network for automation, realtime and/or industrial applications Emerging Cross-Sectional Technologies 2 Active
US9813490B2 Scheduled network communication for efficient re-partitioning of data Electricity 1 Active
US8828518B2 Decorated trim element Emerging Cross-Sectional Technologies 1 Active
US6780085B2 Fiber optical sensor embedded into the polishing pad for in-situ, real-time, monitoring of thin films during the chemical mechanical planarization process Performing Operations; Transporting 1 Expired
US7918712B2 Endpoint detection system for wafer polishing Performing Operations; Transporting 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.