Inventor · Chambéry, FR

Stéphane Hanriat

6Patents
5h-index
3Co-inventors
45Inventor score

Filing activity: Feb 12, 1998 → May 24, 2000

Most-cited inventions

PatentTitleAreaCited byStatus
US6430720B1 Functional testing method and circuit including means for implementing said method Physics 20 Expired
US6363001B1 ROM with a reduced static consumption Physics 15 Expired
US6282114A Low consumption ROM Physics 9 Expired
US6473725B1 Method of accurate simulation of logic circuits Physics 7 Expired
US6253352A Circuit for validating simulation models Physics 6 Expired
US6252449A Clock distribution circuit in an integrated circuit Physics 5 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.