Tae-Heung Ahn
4Patents
1h-index
25Co-inventors
40Inventor score
Filing activity: Dec 1, 2015 → Apr 13, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10001444B2 | Surface inspecting method | Physics | 2 | Active |
| US11029256B2 | Apparatus for measuring wafer | Physics | 1 | Active |
| US10473579B2 | Apparatus for inspecting material property of plurality of measurement objects | Physics | 0 | Active |
| US10733719B2 | Wafer inspection apparatus and wafer inspection method using the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.