Thomas E. Obremski
6Patents
6h-index
10Co-inventors
56Inventor score
Filing activity: Jun 7, 1995 → Nov 22, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5724295A | Partitioned dynamic memory allowing substitution of a redundant circuit in any partition and using partial address disablement and disablement override | Physics | 18 | Expired |
| US6452848B1 | Programmable built-in self test (BIST) data generator for semiconductor memory devices | Physics | 13 | Expired |
| US6388930B1 | Method and apparatus for ram built-in self test (BIST) address generation using bit-wise masking of counters | Physics | 11 | Expired |
| US7103814B2 | Testing logic and embedded memory in parallel | Physics | 8 | Expired |
| US7073100B2 | Method for testing embedded DRAM arrays | Physics | 7 | Expired |
| US7237165B2 | Method for testing embedded DRAM arrays | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.