Thomas Hladschik
4Patents
3h-index
8Co-inventors
39Inventor score
Filing activity: Dec 7, 1999 → Dec 30, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6564346B1 | Advanced bit fail map compression with fail signature analysis | Physics | 22 | Expired |
| US6963813B1 | Method and apparatus for fast automated failure classification for semiconductor wafers | Electricity | 7 | Expired |
| US6493645B1 | Method for detecting and classifying scratches occurring during wafer semiconductor processing | Electricity | 7 | Expired |
| US7003432B2 | Method of and system for analyzing cells of a memory device | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.