Tohru Ando
18Patents
3h-index
33Co-inventors
52Inventor score
Filing activity: Oct 20, 2006 → May 21, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD774075S1 | Display screen with graphical user interface | General | 21 | Active |
| US7663104B2 | Specimen inspection equipment and how to make electron beam absorbed current images | Electricity | 3 | Active |
| US8442300B2 | Specified position identifying method and specified position measuring apparatus | Physics | 3 | Active |
| USD774516S1 | Display screen with graphical user interface | General | 1 | Active |
| US8309922B2 | Semiconductor inspection method and device that consider the effects of electron beams | Electricity | 1 | Active |
| US7732791B2 | Semiconductor testing method and semiconductor tester | Electricity | 1 | Active |
| US9129773B2 | Charged particle beam apparatus | Electricity | 1 | Active |
| US7989766B2 | Sample inspection apparatus | Electricity | 1 | Active |
| USD780767S1 | Display screen with graphical user interface | General | 1 | Active |
| US8178840B2 | Specimen inspection equipment and how to make the electron beam absorbed current images | Electricity | 1 | Active |
| US7700916B2 | Logical CAD navigation for device characteristics evaluation system | Electricity | 1 | Active |
| US9412557B2 | Charged particle beam apparatus and program | Electricity | 0 | Active |
| US9792832B2 | Charged particle beam apparatus, specimen observation system and operation program | Electricity | 0 | Active |
| US8754664B2 | Inspection method and device | Electricity | 0 | Active |
| US10176968B2 | Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for same | Electricity | 0 | Active |
| US8178837B2 | Logical CAD navigation for device characteristics evaluation system | Electricity | 0 | Active |
| US9741531B2 | Charged particle beam device enabling facilitated EBSD detector analysis of desired position and control method thereof | Electricity | 0 | Active |
| US8067752B2 | Semiconductor testing method and semiconductor tester | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.