Toshihiko Wada
21Patents
7h-index
45Co-inventors
69Inventor score
Filing activity: May 19, 1987 → Apr 15, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5855553A | Remote surgery support system and method thereof | Human Necessities | 408 | Expired |
| USD343382S | Frequency inverter | General | 25 | Expired |
| USD349888S | Controller for semi-conductor processing machine | General | 25 | Expired |
| USD352911S | Processing machine for electron beam lithography system | General | 20 | Expired |
| USD650383S1 | Magnetic disc storage unit for electronic computer | General | 11 | Expired |
| US6904190B2 | Optical package substrate, optical device, optical module, and method for molding optical package substrate | Physics | 10 | Expired |
| US6947645B2 | Optical package substrate and optical device | Physics | 10 | Expired |
| USD352910S | Processing machine for electron beam lithography system | General | 7 | Expired |
| US4801334A | Method of and apparatus for cleaning magnetic recording disk cartridge | Emerging Cross-Sectional Technologies | 3 | Expired |
| US7214900B2 | Electrical discharge machine power supply | Performing Operations; Transporting | 2 | Expired |
| USD349464S | Ultrasonic flaw detector system | General | 2 | Expired |
| US6809285B2 | Micro electro discharge machining method and apparatus | Performing Operations; Transporting | 2 | Expired |
| US7908028B2 | Machining device and method | Performing Operations; Transporting | 1 | Active |
| USD360598S | Console for measurement scanner for semi-conductor | General | 1 | Expired |
| US9855612B2 | Method of manufacturing stylus and stylus | Physics | 1 | Active |
| US9950463B2 | Imprinting device | Performing Operations; Transporting | 1 | Active |
| USD350294S | Control unit for an ultrasonic flaw detector | General | 0 | Expired |
| US10105874B2 | Imprinting method and imprinting device | Performing Operations; Transporting | 0 | Active |
| US6720516B2 | apparatus for electric discharge micromachining of a micro-diameter hole | Performing Operations; Transporting | 0 | Expired |
| USD360599S | Measurement scanner for semi-conductor | General | 0 | Expired |
| US9400427B2 | Method of manufacturing fine structure body and fine structure mold | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.