Ulrich Baur
7Patents
5h-index
15Co-inventors
56Inventor score
Filing activity: Dec 28, 1999 → Jun 24, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6490702B1 | Scan structure for improving transition fault coverage and scan diagnostics | Physics | 39 | Expired |
| US6728914B2 | Random path delay testing methodology | Physics | 14 | Expired |
| US6816990B2 | VLSI chip test power reduction | Physics | 11 | Expired |
| US6662324B1 | Global transition scan based AC method | Physics | 11 | Expired |
| US6774656B2 | Self-test for leakage current of driver/receiver stages | Physics | 6 | Expired |
| US6725171B2 | Self-test with split, asymmetric controlled driver output stage | Physics | 5 | Expired |
| US8479070B2 | Integrated circuit arrangement for test inputs | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.