Vinay Shah
15Patents
5h-index
28Co-inventors
66Inventor score
Filing activity: Apr 6, 1989 → Oct 3, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5410536A | Method of error recovery in a data communication system | Electricity | 49 | Expired |
| US5933435A | Optimized method of data communication and system employing same | Electricity | 30 | Expired |
| US4951929A | Refractory assembly including inner and outer refractory members with interference shrink fit therebetween and method of formation thereof | Emerging Cross-Sectional Technologies | 20 | Expired |
| US6996642B2 | Adapter, converted data storage device and method of operation of a converted data storage device | Physics | 14 | Expired |
| US6031767A | Integrated circuit I/O interface that uses excess data I/O pin bandwidth to input control signals or output status information | Physics | 6 | Expired |
| US9525099B2 | Dual-mask arrangement for solar cell fabrication | Emerging Cross-Sectional Technologies | 5 | Active |
| US10115617B2 | System architecture for vacuum processing | Electricity | 3 | Active |
| US8677929B2 | Method and apparatus for masking solar cell substrates for deposition | Emerging Cross-Sectional Technologies | 3 | Active |
| US9077678B1 | Facilitating photo sharing | Electricity | 2 | Active |
| US9502276B2 | System architecture for vacuum processing | Electricity | 2 | Active |
| US10062600B2 | System and method for bi-facial processing of substrates | Electricity | 2 | Active |
| US8910041B1 | Font substitution using unsupervised clustering techniques | Physics | 2 | Active |
| US8998553B2 | High throughput load lock for solar wafers | Electricity | 1 | Active |
| US10106883B2 | Sputtering system and method using direction-dependent scan speed or power | Electricity | 0 | Active |
| US7413994B2 | Hydrogen and oxygen based photoresist removal process | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.